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 Probion is an independant company providing customized material analysis to industry and Research Laboratories. Our service is based on three principles: Reliability Probion uses the most advanced SIMS technology that exists today. Our technical staff has extensive experience in the analysis of surface and thin film composition of silicon based structures as well as compound semiconductors. Probion is ISO 9001:2000 certified. Speed Probion warranties analytical results within 5 business days. Analysis in less than 24 hours can be arranged by special request. Discretion Because the composition of your thin films is critical to your competitive edge, Probion warranties to each customer complete security regarding the analysis of your materials. Please feel free to inquire about the details of this unique guarantee. Activities Probion offers the highest integrity analysis of thin-film chemical composition to the semiconductor and material industry. Products
SIMS allows surface analysis and depth profiling in almost any solid material. Our instruments, 3F and 4F CAMECA, show high sensitivity, extreme dynamic concentration range, together with high depth resolution and ultimate mass separation capability. They are especially useful to measure trace elements undetected by other techniques. This is true for any element, including hydrogen. Secondary ion imaging provides high spatial resolution of a 2D elemental distribution. Our instruments are the only ones offering both imaging modes ion microscope and ion microprobe. RBS provides quantitative analysis (no standards needed) with detection limits down to 0.1%. It is also able to give crystalline damage measurement in crystals. Analysis of non-conducting organic and inorganic solids and powders are possible. TRPL needs a specific equipment (streak camera) to provide carrier lifetime, which is directly related to optoelectronic device performance. |
37, rue de Fontenay - 92220
Bagneux - France
Tel : 33 (0)1 46 12 05 00 - Fax : 33 (0)1 46 54 10 33
info probion.fr