Analysis Service for Industry and Research

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Different types of analysis: SIMS: Secondary ions mass spectrometry - TOF-SIMS: Time of flight SIMS - XPS: X-ray photoelectron spectrometry - RBS: Rutherford back scattering - ECVP: Electrochemical capacitance voltage profiling...

Different types of analysis: SIMS: Secondary ions mass spectrometry - TOF-SIMS: Time of flight SIMS - XPS: X-ray photoelectron spectrometry - RBS: Rutherford back scattering - ECVP: Electrochemical capacitance voltage profiling...

About us

Probion Analysis is an independent company established in 1998 and located near Paris (France). We offer a material analysis service for semiconducting, metallic and insulating materials, providing support for industry and research.

We have extensive experience in analysis of semiconducting and insulating materials with a special expertise in semiconductors: Silicon, III-V (including III-N) and II-VI. We can also analyse the insulating or metallic layers which are routinely associated to semiconductor devices and more generally, we will consider any type of request concerning analysis of solid samples (metallic alloys, glasses, coatings and thin films ...).

With a broad range of analysis tools available (e.g. SIMS, XPS, ECV profiler, TOF-SIMS, RBS, FIB-TEM), we evaluate your issues and we suggest the most appropriate solutions to provide the information you require.