Analysis Service for Industry and Research

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  • Delivery time: 5 business days, Faster delivery on request : 24hrs or 48hrs

    Delivery time: 5 business days, Faster delivery on request : 24hrs or 48hrs

  • Our expertise: CONSULTING- QUICK DELIVERY- CONFIDENTIALITY. We study: Any solid sample and any analysis issue

    Our expertise: CONSULTING- QUICK DELIVERY- CONFIDENTIALITY. We study: Any solid sample and any analysis issue

  • Different types of analysis: SIMS: Secondary ions mass spectrometry - TOF-SIMS: Time of flight SIMS - XPS: X-ray photoelectron spectrometry - RBS: Rutherford back scattering - ECVP: Electrochemical capacitance voltage profiling...

    Different types of analysis: SIMS: Secondary ions mass spectrometry - TOF-SIMS: Time of flight SIMS - XPS: X-ray photoelectron spectrometry - RBS: Rutherford back scattering - ECVP: Electrochemical capacitance voltage profiling...

  • Wide range of analysed materials: Analysis of any solid sample : - Si, Ge, SiGe, SiC... - AlGaAs, InGaAs, InP, GaInP... - GaN, InN, GaAlN... - SiO2, Si3N4, SiOP... - HgCdTe, ZnTe, ZnS, ZnO... - Cu, Au, W, Fe, Ti, Ni, Pd... - Diamond

    Wide range of analysed materials: Analysis of any solid sample : - Si, Ge, SiGe, SiC... - AlGaAs, InGaAs, InP, GaInP... - GaN, InN, GaAlN... - SiO2, Si3N4, SiOP... - HgCdTe, ZnTe, ZnS, ZnO... - Cu, Au, W, Fe, Ti, Ni, Pd... - Diamond

The techniques

Characterization techniques:

SIMS: Secondary Ion Mass Spectrometry

ECVP: Electrochemical capacitance voltage profiling

TOF-SIMS: Time of flight - SIMS

XPS: X-ray Photoelectron Spectrometry

RBS: Rutherford Back Scattering

FIB-TEM: Focused Ion Beam - Transmission Electron Microscopy

Practical information

A wide range of analyzed materials:

  • Semiconductors:

    • - Si, Ge, SiGe, SiC, C (diamond)
    • - GaAs, InP, GaInP, GaAlAs, GaInAsP...
    • - GaN, AlN, InN, GaAlN, GaInN...
    • - CdTe, HgCdTe, HgTe, ZnTe, ZnO

  • Metals:

    • - Cu, Au, W, Ti, Ni, Pd

  • Insulators :
    • - SiO2, Si3N4, BPSG, FSG